These two half-days were dedicated to presenting the main characterization techniques used for studying spintronics samples, whether structural, electronic, or magnetic. The presentations took various forms:

In-depth lectures (one per half-day) on Raman scattering and Brillouin scattering—two spectroscopy techniques for studying material properties.

Extended talks covering topics such as high-time-resolution imaging on synchrotron, material analysis via picosecond acoustics using a femtosecond laser pulse, magnetic microscopy and its extensions with NV centers in diamond, magnetic resonance microscopy, electronic photoemission spectroscopy, and high-resolution spatial and spectroscopic transmission electron microscopy.

Thirteen 20-minute presentations, where speakers were systematically asked to introduce the technique and underlying physical principles before presenting relevant spintronics results. These talks provided an extensive overview of characterization techniques.